The status (open/close) of the SEM load lock chamber can be integrated in the XTrace 2 security circuit - this safety feature ensures that the X-ray shutter cannot be opened when the load lock chamber is open, keeping users safe from X-ray exposure. The advanced safety interlock is designed to work with various SEM models.
Rapid Stage is a modular piezo-based stage, specially designed to mount on top of the existing SEM stage, enabling high-speed elemental X-ray mapping “on the fly” over large areas with up to a speed of 4 mm/s.
The use of
Rapid Stage
allows for the acquisition of X-ray mapping data over a sample size of 50 x 50 mm (or higher), incorporating light element spectral data as well as trace element and/ or higher energy X-ray data in a fast and user-friendly workflow.
Both XTrace 2 and Rapid Stage are seamlessly integrated in
ESPRIT software
.
Identification and Determination of Ore Elements at Trace Levels
Detailed elemental mapping using micro-XRF on SEM (also known as SEM XRF) can used to quickly identify the elements present in ore samples and to determine their distribution. The sensitivity of micro-XRF on SEM allows trace elements, penalty elements and elements that complicate processing to be identified.
Analyze Ores with SEM XRF
Fast Elemental Mapping of Electronic Components in a PCB
Elemental mapping of a PCB can be achieved without any sample preparation using high-speed micro-XRF on SEM, a technique that is able to determine the elements in electronic components at trace levels - this is especially useful for the recovery of valuable elements from used electronic components.
Analyze Electronics with SEM XRF
Exploring Elemental Information in A Credit Card Chip without Sample Prep
In this study, a common credit card chip was investigated for its elemental composition information via SEM EDS and micro-XRF on SEM. This combination allows for the elemental mapping of features both on and below the sample surface.
Map below the sample surface with SEM XRF
Elemental and Mineral distribution in Exotic-Cu Deposits
The ability to observe elemental changes within samples is important to understand geological processes and ore deposit genesis. The dual source system which incorporates a micro-XRF on a SEM enables elemental X-ray mapping over large areas, which shows major, minor and also trace elements on the ppm scale.
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Large Area Mapping of Mineralogical Samples
The new Rapid Stage is specifically designed for SEMs to enable large area mapping over millimeter (mm) to centimeter (cm) scales. This will eliminate potential SEM X-ray intensity variation artifacts associated with low magnification mapping and thus enhance elemental and mineralogical information in a timeous manor that was previously not possible.
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Mantle Petrology and the Source of Diamonds
We present a SEM-XRF element map of a mantle garnet-spinel peridotite from the diamond-bearing Newlands kimberlite (South Africa, Kaapvaal Craton). The intensity of the various elements indicates certain minerals that are present in the sample.
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Dual Source Applications for Exploration and Mining: Au-bearing Epithermal Samples
The combination of micro-XRF with SEM enables the potential to analyze samples at multiple scales, from centimeters (cm) to millimeters (mm) to micrometers (µm) and below within a solitary system. Thus, by adding the micro-XRF to an SEM you convert your SEM to a dual source system, meaning that there are 2 excitations sources, the e-beam and photon beam. Either source can be used individually, or simultaneously, to generate sample X-rays that will be measured using the same EDS detector.
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Identification of Contaminants and Toxins in Soils
Large Area Mapping (Hypermaps) using SEM-XRF can be performed on samples with topography. That is, minimal sample preparation is required and the sample can be analyzed directly without any degredation. This is particularly relevant in the analysis of soils, where any form of sample preparation, such as mounting and polishing or carbon coating, may alter the specimen.
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Thin Film Analysis with SEM micro-XRF
As X-rays may pass through matter, X-ray Fluorescence (XRF) allows the determination of layer thickness. Using micro-XRF on SEM, the layer analysis (thickness and composition) is rendered feasible with spatial resolution at the micrometer scale. Layer analysis is strongly based on quantification using atomic fundamental parameter (FP).
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